Francy Kunnel Abraham
Associate Research Fellow at Intel Corp
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | May 1, 2011
OE Vol. 50 Issue 05
KEYWORDS: Fourier transforms, Integrated circuits, Computer simulations, Imaging systems, 3D metrology, Inspection, CCD cameras, Cameras, Projection systems, Optical engineering

PROCEEDINGS ARTICLE | August 18, 1997
Proc. SPIE. 3185, Automatic Inspection and Novel Instrumentation
KEYWORDS: Visualization, Materials processing, Manufacturing, Inspection, Control systems, Optical inspection, Lead

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