Dr. Frank E. Gennari
Senior Member of Consulting Staff at
SPIE Involvement:
Author
Publications (15)

PROCEEDINGS ARTICLE | April 10, 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Lithography, Data modeling, Manufacturing, Feature extraction, Design for manufacturing, Machine learning, Testing and analysis, Model-based design

PROCEEDINGS ARTICLE | March 30, 2017
Proc. SPIE. 10148, Design-Process-Technology Co-optimization for Manufacturability XI
KEYWORDS: Analytics, Logic, Optical lithography, Statistical analysis, Databases, Metals, Silicon, Manufacturing, Computer simulations, Design for manufacturing, Charge-coupled devices, Optical proximity correction, Digital electronics, Product engineering, Yield improvement, Model-based design, Process modeling, Design for manufacturability

PROCEEDINGS ARTICLE | March 16, 2016
Proc. SPIE. 9781, Design-Process-Technology Co-optimization for Manufacturability X
KEYWORDS: Logic, Optical lithography, Databases, Metals, Manufacturing, Optical proximity correction, Raster graphics, Digital electronics, Product engineering, System on a chip

PROCEEDINGS ARTICLE | March 16, 2016
Proc. SPIE. 9781, Design-Process-Technology Co-optimization for Manufacturability X
KEYWORDS: Semiconductors, Data mining, Lithography, Databases, Metals, Silicon, Manufacturing, Computer simulations, Mining, Design for manufacturing, Machine learning, Semiconductor manufacturing, Image classification, Charge-coupled devices, Optical proximity correction, Design for manufacturability

PROCEEDINGS ARTICLE | March 28, 2014
Proc. SPIE. 9053, Design-Process-Technology Co-optimization for Manufacturability VIII
KEYWORDS: Logic, Metals, Manufacturing, Electroluminescence, Design for manufacturing, Image classification, Tolerancing, Fuzzy logic, Library classification systems, Design for manufacturability

PROCEEDINGS ARTICLE | March 28, 2014
Proc. SPIE. 9053, Design-Process-Technology Co-optimization for Manufacturability VIII
KEYWORDS: Data mining, Lithography, Databases, Image processing, Silicon, Manufacturing, Image classification, Optical proximity correction, Raster graphics, Tolerancing

Showing 5 of 15 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top