Mr. Frank Hertlein
at Incoatec GmbH
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10387, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI
KEYWORDS: X-rays, X-ray optics, X-ray sources, Analytics, Crystals, Single crystal X-ray diffraction, Diffraction, Electron beams, Mirrors, X-ray diffraction

PROCEEDINGS ARTICLE | September 9, 2009
Proc. SPIE. 7448, Advances in X-Ray/EUV Optics and Components IV
KEYWORDS: X-ray optics, X-rays, Multilayers, Capillaries, X-ray sources, Optics manufacturing, Beam shaping, Free electron lasers, Reflectometry, Wafer-level optics

PROCEEDINGS ARTICLE | September 3, 2008
Proc. SPIE. 7077, Advances in X-Ray/EUV Optics and Components III
KEYWORDS: Mirrors, Multilayers, Sputter deposition, Carbon, X-rays, Reflectivity, X-ray optics, Optical coatings, Light sources, Synchrotrons

PROCEEDINGS ARTICLE | May 18, 2007
Proc. SPIE. 6586, Damage to VUV, EUV, and X-ray Optics
KEYWORDS: Multilayers, X-ray optics, Free electron lasers, Reflection, Coating, Optics manufacturing, Reflectivity, Synchrotrons, Mirrors, Carbon

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