Dr. Frank Siewert
at Helmholtz-Zentrum Berlin
SPIE Involvement:
Conference Program Committee | Author
Publications (25)

PROCEEDINGS ARTICLE | June 20, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Mirrors, Multilayers, Beam splitters, X-rays, Wavefronts, Wave propagation, Optical simulations, Picosecond phenomena, Hard x-rays, Free electron lasers

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Reflection, Photons, Molecules, Diffusion, Polymerization, Palladium, Synchrotrons, Analytical research, Probability theory, Crystallography

PROCEEDINGS ARTICLE | October 8, 2014
Proc. SPIE. 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
KEYWORDS: Temporal coherence, Mirrors, Multilayers, Beam splitters, X-rays, Coating, Reflectivity, Wavefronts, Adaptive optics, Picosecond phenomena

PROCEEDINGS ARTICLE | September 17, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Mirrors, Multilayers, Light sources, Reflection, Crystals, X-rays, Silicon, Reflectivity, Wavefronts, Monochromators

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Mirrors, Metrology, Calibration, Inspection, Computer programming, Optical testing, Head, Autocollimators, Synchrotrons, Optics manufacturing

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9208, Adaptive X-Ray Optics III
KEYWORDS: Actuators, Mirrors, X-ray optics, Error analysis, X-rays, Adaptive optics, Inverse problems, Grazing incidence, Free electron lasers, Surface finishing

Showing 5 of 25 publications
Conference Committee Involvement (6)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
Showing 5 of 6 published special sections
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