Frank Sill
at Univ Federal de Minas Gerais
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 28, 2009
Proc. SPIE. 7363, VLSI Circuits and Systems IV
KEYWORDS: Oxides, Logic, Switching, Manufacturing, Reliability, Transistors, Integrated circuits, Computer aided design, System integration, Integrated circuit design

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