Dr. Frantisek Vizda
at Univ of Defence
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 24, 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Thin films, Ellipsometry, Spectroscopy, Reflectivity, Imaging spectroscopy, CCD cameras, Reflectometry, Spectroscopic ellipsometry, Reflectance spectroscopy, Intelligence systems

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