Dr. Franz Schaefers
Scientist at Helmholtz-Zentrum Berlin
SPIE Involvement:
Author
Publications (20)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Carbon, Optical components, X-ray optics, Metrology, Contamination, X-rays, Reflectivity, Reflectometry, Synchrotron radiation, Scanning tunneling microscopy

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Optical components, Mirrors, Metrology, LabVIEW, Polarization, Sensors, Reflectivity, Reflectometry, Extreme ultraviolet, Monochromators

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Optical components, Mirrors, Metrology, Sensors, Reflectivity, Reflectometry, Collimation, Extreme ultraviolet, Monochromators, Diffraction gratings

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
KEYWORDS: Spectroscopy, Crystals, X-rays, Diodes, Synchrotrons, Laser crystals, X-ray lasers, Monochromators, Free electron lasers, Prototyping

PROCEEDINGS ARTICLE | September 23, 2011
Proc. SPIE. 8141, Advances in Computational Methods for X-Ray Optics II
KEYWORDS: Sensors, Crystals, X-rays, Spectrometers, Silicon, Diagnostics, Ray tracing, Zone plates, Monochromators, Free electron lasers

PROCEEDINGS ARTICLE | September 14, 2005
Proc. SPIE. 5919, Soft X-Ray Lasers and Applications VI
KEYWORDS: Carbon, Mirrors, Multilayers, X-ray optics, Microscopy, X-rays, X-ray microscopy, Reflectivity, Cobalt, X-ray imaging

Showing 5 of 20 publications
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