Frédéric P. Pistone
Development Engineer at Thales Alenia Space
SPIE Involvement:
Author
Publications (19)

PROCEEDINGS ARTICLE | November 17, 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: Readout integrated circuits, Infrared detectors, Long wavelength infrared, Signal to noise ratio, Mid-IR, Sensors, Video, Black bodies, Infrared radiation, Astronomical imaging

PROCEEDINGS ARTICLE | December 16, 2010
Proc. SPIE. 7854, Infrared, Millimeter Wave, and Terahertz Technologies
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared detectors, Nonuniformity corrections, Mercury cadmium telluride, Sensors, Modulation transfer functions, Spatial resolution, Medium wave, Temperature metrology

PROCEEDINGS ARTICLE | October 29, 2010
Proc. SPIE. 7834, Electro-Optical and Infrared Systems: Technology and Applications VII
KEYWORDS: Staring arrays, Readout integrated circuits, Mid-IR, Avalanche photodetectors, Liquid phase epitaxy, Mercury cadmium telluride, Cadmium, Dispersion, Ultraviolet radiation, Medium wave

PROCEEDINGS ARTICLE | October 29, 2010
Proc. SPIE. 7834, Electro-Optical and Infrared Systems: Technology and Applications VII
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared detectors, Nonuniformity corrections, Infrared sensors, Avalanche photodetectors, Mercury cadmium telluride, Sensors, Medium wave, Temperature metrology

PROCEEDINGS ARTICLE | October 28, 2010
Proc. SPIE. 7834, Electro-Optical and Infrared Systems: Technology and Applications VII
KEYWORDS: Staring arrays, Readout integrated circuits, Signal to noise ratio, Avalanche photodetectors, Mercury cadmium telluride, LIDAR, 3D metrology, Pulsed laser operation, 3D image processing, Ranging

PROCEEDINGS ARTICLE | May 4, 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Staring arrays, Readout integrated circuits, Nonuniformity corrections, Capacitors, LIDAR, Photons, 3D metrology, Pulsed laser operation, 3D image processing, Ranging

Showing 5 of 19 publications
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