Dr. Fredrik Eriksson
at Linköping University
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | September 8, 2005
Proc. SPIE. 5900, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II
KEYWORDS: Telescopes, Multilayers, Sun, Annealing, Particles, Remote sensing, X-rays, Reflectivity, Extreme ultraviolet, Thermal modeling

PROCEEDINGS ARTICLE | October 14, 2004
Proc. SPIE. 5538, Optical Constants of Materials for UV to X-Ray Wavelengths
KEYWORDS: Mirrors, Multilayers, X-rays, Silicon, Reflectivity, Optical testing, Refraction, Extreme ultraviolet, Scandium, Absorption

SPIE Journal Paper | November 1, 2002
OE Vol. 41 Issue 11
KEYWORDS: Reflectivity, Ions, X-rays, Interfaces, Argon, Chromium, Hard x-rays, Plasma, Sputter deposition, Mirrors

PROCEEDINGS ARTICLE | December 20, 2001
Proc. SPIE. 4506, Soft X-Ray and EUV Imaging Systems II
KEYWORDS: Multilayers, Argon, Sputter deposition, X-rays, Interfaces, Ions, Reflectivity, Chromium, Hard x-rays, Plasma

PROCEEDINGS ARTICLE | November 2, 2000
Proc. SPIE. 4144, Advances in Laboratory-based X-Ray Sources and Optics
KEYWORDS: Mirrors, Multilayers, Reflection, Error analysis, X-rays, Reflectivity, Computing systems, Reflectometry, X-ray detectors, Data analysis

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