Fredrik Forsberg
at KTH Royal Institute of Technology
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | May 1, 2014
Proc. SPIE. 9133, Silicon Photonics and Photonic Integrated Circuits IV
KEYWORDS: Thermography, Infrared imaging, Photodetectors, Resistance, Platinum, Resistors, Thermal modeling, Temperature metrology, Light, Nanowires

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Bolometers, Reflectors, Quantum wells, Sensors, Silicon, Resistance, Infrared radiation, Semiconducting wafers, Wafer bonding, Absorption

PROCEEDINGS ARTICLE | May 14, 2010
Proc. SPIE. 7726, Optical Sensing and Detection
KEYWORDS: Bolometers, Microelectromechanical systems, Readout integrated circuits, Infrared bolometers, Quantum wells, Germanium, Copper, Semiconducting wafers, Wafer bonding, Tin

SPIE Journal Paper | March 1, 2009
OE Vol. 48 Issue 03
KEYWORDS: Transducers, Reconstruction algorithms, 3D image processing, Digital holography, Tomography, Phase measurement, Sensors, Radio propagation, Acoustics, Vibrometry

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Digital signal processing, Speckle, Opacity, Sensors, Image processing, Particles, X-rays, Tungsten, Speckle pattern, Motion measurement

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