Friedel Koerfer
at Fraunhofer-Institut für Produktionstechnologie IPT
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 17 June 2009 Paper
R. Schmitt, F. Koerfer, J. Seewig, W. Osten, A. Weckenmann
Proceedings Volume 7390, 73900C (2009) https://doi.org/10.1117/12.827339
KEYWORDS: Calibration, Confocal microscopy, Microscopes, Inspection, Standards development, Sensors, Interferometry, Environmental sensing, Manufacturing, Interferometers

Proceedings Article | 24 March 2006 Paper
Friedel Koerfer, Sandra Scheermesser
Proceedings Volume 6152, 61520M (2006) https://doi.org/10.1117/12.656330
KEYWORDS: Microscopes, Ray tracing, Light sources, Calibration, Device simulation, Wavefronts, Optical components, Virtual reality, Environmental sensing, Sensors

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