Mr. Fu-Chen Hsiao
at Academia Sinica
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 26, 2015
Proc. SPIE. 9554, Nanoimaging and Nanospectroscopy III
KEYWORDS: Ellipsometry, Diffraction, Optical spheres, Polarization, Silicon, Light scattering, Reflectivity, Polarizers, Specular reflections, Zinc oxide

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top