Dr. Fujiang Lin
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 November 2019
Proc. SPIE. 11192, Real-time Photonic Measurements, Data Management, and Processing IV
KEYWORDS: Wafer-level optics, Optical design, Waveguides, Modulators, Optical testing, Silicon photonics, Electro optics, Active optics, Wafer testing, Electro-optic testing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top