Fuqiang He
at Zhejiang Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 March 2006
Proc. SPIE. 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials
KEYWORDS: Defect detection, Image segmentation, Matrices, Inspection, Image restoration, Machine vision, Image filtering, Algorithm development, Cesium, Enhanced vision

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