Prof. Futoshi Iwata Profile

Prof. Futoshi Iwata

at Shizuoka Univ

SPIE Involvement:

Author

Publications (2)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 16 November 2011 Paper

Measurement and deposition of nanometer-scale Cu dot using an atomic force microscope with a nanopipette probe in liquid condition

So Ito, Koji Yamazaki, Futoshi Iwata

Proceedings Volume 8321, 83213D (2011) https://doi.org/10.1117/12.905290

KEYWORDS: Liquids, Copper, Gold, Deposition processes, Metals, Plating, Atomic force microscope, Electrodes, Glasses, Sensors

Read Abstract +

In this study, we developed novel techniques of nanometer-scale measurement and deposition using an atomic force microscope (AFM) with a nanopipette in liquid condition. The nanopipette, filled with CuSO₄ electrolyte solution, was employed as the AFM probe. Observation and deposition of nanometer-scale Cu dots were carried out using the nanopipette probe. In order to avoid drying of the nanopipette solution and clogging of the probe-edge aperture, Cu dots were deposited and measured in liquid condition. As for the measurement of the surface, the nanopipette probe was glued on a tuning fork quartz crystal resonator (TF-QCR) to detect a probe oscillation and vertically oscillated to use a method of frequency modulation in tapping-mode AFM. With regard to the deposition of nanometer-scale Cu dot, an electrode wire inside the electrolyte-filled nanopipette and conductive surface of Au coated glass slide were employed as the anode and cathode, respectively. By utilizing the probe-surface distance control during the deposition, nanometerscale Cu dot were successfully deposited on Au surface without the diffusion. Then, the deposited dots were observed by using the nanopipette probe. This technique of the local deposition in the liquid would be applicable for various fields such as fabrication of micro/nanometer-scale devices and arrangement of biological samples.

Proceedings Article | 12 January 2009 Paper

Nanometer-scale manipulator and ultrasonic cutter using an atomic force microscope controlled by a haptic device

F. Iwata, S. Kawanishi, A. Sasaki, H. Aoyama, T. Ushiki

Proceedings Volume 7133, 71334E (2009) https://doi.org/10.1117/12.821253

Read Abstract +

We describe a nanometer-scale manipulatoion and cutting method using ultrasonic oscillation scratching. The system is based on a modified atomic force microscope (AFM) coupled with a haptic device as a human interface. By handling the haptic device, the operator can directly move the AFM probe to manipulate nanometer scale objects and cut a surface while feeling the reaction from the surface in his or her fingers. As for manipulation using the system, nanometer-scale spheres were controllably moved by feeling the sensation of the AFM probe touching the spheres. As for cutting performance, the samples were prepared on an AT-cut quartz crystal resonator (QCR) set on an AFM sample holder. The QCR oscillates at its resonance frequency (9 MHz) with an amplitude of a few nanometers. Thus it is possible to cut the sample surface smoothly by the interaction between the AFM probe and the oscillating surface, even when the samples are viscoelastics such as polymers and biological samples. The ultrasonic nano-manipulation and cutting system would be a very useful and effective tool in the fields of nanometer-scale engineering and biological sciences.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years