Göran Maconi
at Univ of Helsinki
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Diffraction, Super resolution, Optical spheres, Polymers, Glasses, Interferometry, 3D modeling, Monte Carlo methods, Objectives, Semiconducting wafers

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Microscopes, Diffraction, Finite-difference time-domain method, Super resolution, Optical spheres, Light scattering, Monte Carlo methods, Near field, Objectives, Device simulation

Proceedings Article | 22 February 2018 Presentation + Paper
Proc. SPIE. 10539, Photonic Instrumentation Engineering V
KEYWORDS: Diffraction, Super resolution, Stereoscopy, Polymers, Image resolution, Near field scanning optical microscopy, 3D metrology, 3D vision, 3D image processing, Near field optics

Proceedings Article | 22 February 2018 Presentation + Paper
Proc. SPIE. 10539, Photonic Instrumentation Engineering V
KEYWORDS: Optical spheres, Polarization, Scattering, Calibration, Glasses, Particles, Light scattering, Laser scattering, Polarizers, Scatter measurement

Proceedings Article | 26 June 2017 Paper
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Linear polarizers, Tunable lasers, Calibration, Particles, Photomultipliers, Light scattering, Polarizers, Optical testing, Spherical lenses, Scatter measurement, Particle systems

Showing 5 of 7 publications
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