Gabriel V. Claudiano
at CNPEM
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Mirrors, Metrology, Spatial frequencies, Synchrotrons, Finite element methods, X-rays

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top