The dynamic spectral properties of Continuous Wave (CW) semiconductor lasers during continuous wavelength current tuning process (i.e. slope efficiency, dynamic wavelength current tuning rate and dynamic linewidth) are of utmost significance to high resolution molecular spectroscopy and trace gas detection. In this paper, a system for measuring dynamic spectral properties was setup based on a short-delayed self-heterodyne interferometry with different Optical Path Difference (OPD). And the dynamic spectral properties of different Distributed Feedback (DFB) semiconductor lasers were tested respectively by the system combined with a special time-frequency analysis method. The dynamic slope efficiency unveils nonlinear optical intensity that can’t be neglected in dealing with Residual Amplitude Modulation (RAM). The dynamic wavelength current tuning rate can be used to calibrate laser wavelength. The dynamic linewidth of a laser can be used to evaluate the spectral resolution in gas detecting. The system was demonstrated to simultaneously measure the dynamic spectral properties of different types of tunable lasers with a wavelength range in 2 μm ~ 8 μm during the tuning process. These dynamic spectral properties were distinctly different with the properties while the laser operates at a stable state, which may lay a foundation for deep research and enrichment the highly-precise spectrum database in gas sensing fields.