Gang Rao
at Tsinghua Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Fringe analysis, Visualization, Imaging systems, Cameras, Calibration, Robotics, Computer programming, Volume rendering, Projection systems, 3D image processing

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