Gang Wu
at Institute of Automation
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 11 August 1998
Proc. SPIE. 3553, Detectors, Focal Plane Arrays, and Imaging Devices II
KEYWORDS: Polishing, Reflection, Crystals, X-rays, X-ray diffraction, Physics, Wet etching, Semiconducting wafers, Surface finishing, Single crystal X-ray diffraction

Proceedings Article | 25 September 1996
Proc. SPIE. 2894, Detectors, Focal Plane Arrays, and Applications
KEYWORDS: Liquid phase epitaxy, Cadmium, Etching, Crystals, X-rays, X-ray diffraction, Infrared radiation, Epitaxy, Semiconducting wafers, Tellurium

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