Mr. Gao Wang
at North Univ of China
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | May 1, 2010
OE Vol. 49 Issue 05
KEYWORDS: Printed circuit board testing, X-rays, Reconstruction algorithms, Nondestructive evaluation, Sensors, Optical engineering, X-ray imaging, X-ray computed tomography, Imaging systems, Computer simulations

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