Mr. Gao Zhiliang
at National Institute for Measurement & Testing Tech
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Calibration, Particles, Error analysis, Light scattering, Physics, Scanning electron microscopy, Electron microscopy, Uncertainty analysis, Atmospheric particles, Standards development

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