Zhiliang Gao
at National Institute for Measurement & Testing Tech
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Metrology, Statistical analysis, Calibration, Particles, Error analysis, Process control, Aerodynamics, Atmospheric particles, Particle systems, Contamination control

Proceedings Article | 6 March 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Calibration, Particles, Error analysis, Light scattering, Physics, Scanning electron microscopy, Electron microscopy, Uncertainty analysis, Atmospheric particles, Standards development

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