Prof. Gaofa He
at Chongqing Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Resonators, Electrodes, Scanners, Microscopy, Dielectrics, Atomic force microscopy, Finite element methods, Scanning probe microscopy, Prototyping, Dielectric polarization

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