Gaofeng Wu
at Institute of Electronics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 September 2016 Paper
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Data modeling, Optical testing, Inverse problems, Pixel resolution, Reconstruction algorithms, Spatial resolution, Optimization (mathematics), Iterative methods, Process modeling, Inverse optics

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