Dr. Garrett D. Cole
President & CEO at Crystalline Mirror Solutions LLC
SPIE Involvement:
Conference Program Committee | Author
Publications (11)

PROCEEDINGS ARTICLE | November 26, 2018
Proc. SPIE. 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference
KEYWORDS: Semiconductors, Mirrors, Multilayers, Laser induced damage, Crystals, Optical coatings, Optical testing, Laser damage threshold, Laser crystals, Absorption

PROCEEDINGS ARTICLE | February 19, 2018
Proc. SPIE. 10552, Vertical-Cavity Surface-Emitting Lasers XXII
KEYWORDS: Mid-IR, Mirrors, Quantum wells, Continuous wave operation, Gallium arsenide, Gallium antimonide, Vertical cavity surface emitting lasers, Optical pumping

PROCEEDINGS ARTICLE | April 21, 2017
Proc. SPIE. 10090, Laser Resonators, Microresonators, and Beam Control XIX
KEYWORDS: Mid-IR, Mirrors, Multilayers, Interferometers, Crystals, Optical coatings, Interferometry, Laser resonators, Precision optics, Absorption

PROCEEDINGS ARTICLE | May 19, 2016
Proc. SPIE. 9822, Advanced Optics for Defense Applications: UV through LWIR
KEYWORDS: Thermography, Mid-IR, Near infrared, Reflectors, Mirrors, Multilayers, Crystals, Optical coatings, Optics manufacturing, Absorption

PROCEEDINGS ARTICLE | May 17, 2013
Proc. SPIE. 8763, Smart Sensors, Actuators, and MEMS VI
KEYWORDS: Actuators, Mirrors, Eye, Tunable lasers, Optical coherence tomography, Spectroscopy, Imaging spectroscopy, Vertical cavity surface emitting lasers, Spectroscopes, Absorption

PROCEEDINGS ARTICLE | October 10, 2012
Proc. SPIE. 8458, Optical Trapping and Optical Micromanipulation IX
KEYWORDS: Optomechanical design, Mirrors, Multilayers, Resonators, Crystals, Dielectrics, Coating, Reflectivity, Precision measurement, Cryogenics

Showing 5 of 11 publications
Conference Committee Involvement (3)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
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