Mr. Gary P. Centers
Post Baccalaureate Research Fellow at Lawrence Berkeley National Lab
SPIE Involvement:
Author
Area of Expertise:
precision measurement , x-ray optics , metrology , metrology instrumentation , data analysis
Publications (4)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Metrology, X-ray optics, Mirrors, Nano opto mechanical systems, Calibration, Synchrotron radiation, Light sources, Diffraction, Light, Interferometry

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: X-ray optics, Interferometry, Metrology, Optical metrology, Calibration, Optics manufacturing, Data analysis, Microscopes

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Metrology, Mirrors, Surface finishing, Stochastic processes, X-rays, Modulation transfer functions, Point spread functions, Data modeling, Optical transfer functions, Electronic filtering

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Interferometry, X-ray optics, Metrology, Calibration, Mirrors, Lawrencium, Spherical lenses, Sensors, Charge-coupled devices, Beam splitters

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