Mr. Gary P. Centers
Post Baccalaureate Research Fellow at Lawrence Berkeley National Lab
SPIE Involvement:
Author
Area of Expertise:
precision measurement , x-ray optics , metrology , metrology instrumentation , data analysis
Publications (4)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Diffraction, Mirrors, Light sources, X-ray optics, Metrology, Nano opto mechanical systems, Calibration, Interferometry, Synchrotron radiation, Light

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Microscopes, X-ray optics, Metrology, Calibration, Interferometry, Optical metrology, Optics manufacturing, Data analysis

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Optical transfer functions, Point spread functions, Mirrors, Metrology, Data modeling, X-rays, Modulation transfer functions, Electronic filtering, Stochastic processes, Surface finishing

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Mirrors, Beam splitters, X-ray optics, Metrology, Sensors, Calibration, Interferometry, Charge-coupled devices, Spherical lenses, Lawrencium

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