Gary P. Centers
Post Baccalaureate Research Fellow at Lawrence Berkeley National Lab
SPIE Involvement:
Author
Area of Expertise:
precision measurement , x-ray optics , metrology , metrology instrumentation , data analysis
Publications (7)

Proceedings Article | 17 September 2018
Proc. SPIE. 10760, Advances in X-Ray/EUV Optics and Components XIII
KEYWORDS: Mirrors, X-ray optics, Metrology, Sensors, Calibration, X-rays, Gaussian filters, Autocollimators

Proceedings Article | 18 January 2018
Proc. SPIE. 10612, Thirteenth International Conference on Correlation Optics
KEYWORDS: Mirrors, X-ray optics, Metrology, Switching, Sensors, Calibration, Error analysis, X-rays, Data acquisition, Deflectometry

Proceedings Article | 19 September 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Diffraction, Light sources, X-ray optics, Metrology, Calibration, Microscopy, Interferometry, Optical testing, Optical metrology, Data processing

Proceedings Article | 7 September 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Microscopes, X-ray optics, Metrology, Calibration, Interferometry, Optical metrology, Optics manufacturing, Data analysis

Proceedings Article | 7 September 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Diffraction, Mirrors, Light sources, X-ray optics, Metrology, Nano opto mechanical systems, Calibration, Interferometry, Synchrotron radiation, Light

Showing 5 of 7 publications
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