Mr. Gastón A. Ayubi
at Univ de la República
SPIE Involvement:
Conference Program Committee | Author
Publications (4)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Fringe analysis, Phase shifting, Interferometry, Computer simulations, Optical testing, Phase retrieval, Wave propagation, Profiling, 3D metrology, Reconstruction algorithms, Phase measurement, 3D profiling, Phase shifts

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Fringe analysis, Detection and tracking algorithms, Error analysis, Interferometry, Computer simulations, Phase retrieval, Picosecond phenomena, Phase measurement, Algorithm development, Phase shifts

PROCEEDINGS ARTICLE | October 24, 2012
Proc. SPIE. 8511, Infrared Remote Sensing and Instrumentation XX
KEYWORDS: Mirrors, Edge detection, Digital image processing, Cameras, Image processing, LCDs, Digital imaging, Micromirrors, Image enhancement, RGB color model

SPIE Journal Paper | October 1, 2012
OE Vol. 51 Issue 10
KEYWORDS: Binary data, 3D metrology, Cameras, Profiling, Projection systems, Fringe analysis, Nonlinear response, Complex systems, Video, Calibration

Conference Committee Involvement (1)
Interferometry XIX
22 August 2018 | San Diego, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top