Gastón A. Ayubi
at Univ de la República
SPIE Involvement:
Conference Program Committee | Author
Publications (5)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Phase shifts, Phase retrieval, Interferometry, Fringe analysis, Phase measurement

Proceedings Article | 26 June 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Phase shifts, Interferometry, Phase shifting, Phase retrieval, 3D metrology, 3D profiling, Profiling, Reconstruction algorithms, Phase measurement, Optical testing, Computer simulations, Wave propagation, Fringe analysis

Proceedings Article | 22 June 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Phase shifts, Error analysis, Interferometry, Phase retrieval, Picosecond phenomena, Phase measurement, Algorithm development, Detection and tracking algorithms, Computer simulations, Fringe analysis

Proceedings Article | 24 October 2012
Proc. SPIE. 8511, Infrared Remote Sensing and Instrumentation XX
KEYWORDS: Image enhancement, Image processing, LCDs, Digital image processing, Micromirrors, Digital imaging, RGB color model, Cameras, Edge detection, Mirrors

SPIE Journal Paper | 1 October 2012
OE Vol. 51 Issue 10
KEYWORDS: Binary data, 3D metrology, Cameras, Profiling, Projection systems, Fringe analysis, Nonlinear response, Complex systems, Video, Calibration

Conference Committee Involvement (2)
Interferometry XX
25 August 2020 | San Diego, California, United States
Interferometry XIX
21 August 2018 | San Diego, California, United States
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