Dr. Gea Oswah Fatah Parikesit
at Univ Gadjah Mada
SPIE Involvement:
Author
Profile Summary

Dr. Gea O. F. Parikesit joined the Department of Engineering Physics at the Faculty of Engineering in the Gadjah Mada University in Indonesia in November 2009, following a two-year post-doctoral research work on Nano-Particle Image Velocimetry performed at Prof. J. Westerweel's Laboratory of Aero- and Hydro-Dynamics at the Delft University of Technology. He obtained his degrees from the Delft University of Technology in The Netherlands (Dr. in Applied Physics with research work on Nanofluidic Electrokinetics of DNA Molecules performed at Prof. I. T. Young's Quantitative Imaging Research Group; M. Sc. in Applied Physics with research work on LASER Frequency Stabilization performed at Prof. J. J. M. Braat's Optics Research Group) and the Bandung Institute of Technology in Indonesia (S. T. in Engineering Physics with research work on LASER Beam Manipulation performed at Prof. A. Handojo's Optics Laboratory).

Publications (5)

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Light sources, Microscopy, Sensors, 3D displays, 3D metrology, Light, Image sensors, Microscopes, 3D image processing, Dimensional metrology

SPIE Journal Paper | November 1, 2010
OE Vol. 49 Issue 11
KEYWORDS: Microscopes, Microscopy, Image resolution, Translucency, Optical engineering, Cameras, Digital imaging, Sensors, Fourier transforms, CMOS sensors

PROCEEDINGS ARTICLE | January 22, 2005
Proc. SPIE. 5718, Microfluidics, BioMEMS, and Medical Microsystems III
KEYWORDS: Molecules, Dielectrophoresis, Particles, Microfluidics, Electrodes, Spectral resolution, Liquids, Interfaces, Microscopes, Confocal microscopy

PROCEEDINGS ARTICLE | October 8, 2004
Proc. SPIE. 5515, Nanoengineering: Fabrication, Properties, Optics, and Devices
KEYWORDS: Particles, Liquids, Molecules, Electrodes, Dielectrophoresis, Interfaces, Aluminum, Luminescence, Singular optics, Nanolithography

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Interferometers, Absorption, Heterodyning, Light sources, Laser stabilization, Helium neon lasers, Phase measurement, Metrology, Mirrors, Iodine

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