Mr. Geng Niu Profile

Geng Niu

at Institute of Electrical Engineering

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Publications (5)

Proceedings Article | 6 February 2019 Paper

A true-color nano-CT based on SEM

Weixia Zhao, Junbiao Liu, Geng Niu, Yutian Ma, Yan Wang, Li Han

Proc. SPIE. 10842, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subdiffraction-limited Plasmonic Lithography and Innovative Manufacturing Technology

KEYWORDS: Principal component analysis, X-ray computed tomography, CT reconstruction, Image segmentation, X-rays, Chromium, Scanning electron microscopy, Computed tomography, X-ray imaging

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Proceedings Article | 24 January 2019 Paper

Design and fabrication of a new tungsten-diamond transmission target for micro-computed tomography

Geng Niu, Junbiao Liu, Yutian Ma, Han Li, Weixia Zhao

Proc. SPIE. 10840, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Micro- and Nano-Optics, Catenary Optics, and Subwavelength Electromagnetics

KEYWORDS: Electron beams, Sputter deposition, X-rays, Monte Carlo methods

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Proceedings Article | 25 October 2016 Paper

Research on the electron beam spot detection methods based on SEM

Weixia Zhao, Junbiao Liu, Geng Niu, Yutian Ma, Li Han

Proc. SPIE. 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics

KEYWORDS: Electron beams, Reticles, Edge detection, Calibration, Metals, X-ray sources, Silicon, Scanning electron microscopy, Semiconducting wafers, Signal detection

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Proceedings Article | 25 October 2016 Paper

X-ray microscopy using reflection targets based on SEM with tungsten filament

Junbiao Liu, Yutian Ma, Weixia Zhao, Geng Niu, Mingzhang Chu, Bohua Yin, Li Han, Baodong Liu

Proc. SPIE. 9685, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials

KEYWORDS: Electron beams, Sensors, Signal attenuation, X-rays, Tungsten, X-ray microscopy, Scanning electron microscopy, X-ray imaging, Beryllium, X-ray detectors

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Proceedings Article | 25 October 2016 Paper

Researches on stability of microfocus electron-impact x-ray source

Yu-tian Ma, Jun-Biao Liu, Wei-xia Zhao, Geng Niu, Li Han

KEYWORDS: Electron beams, Lenses, Sensors, Electrodes, X-rays, Tungsten, X-ray sources, Magnetism, Spatial resolution, X-ray imaging

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