Geng Niu
at Institute of Electrical Engineering
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 6 February 2019
Proc. SPIE. 10842, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subdiffraction-limited Plasmonic Lithography and Innovative Manufacturing Technology
KEYWORDS: X-rays, X-ray computed tomography, X-ray imaging, Image segmentation, Scanning electron microscopy, CT reconstruction, Computed tomography, Principal component analysis, Chromium

Proceedings Article | 24 January 2019
Proc. SPIE. 10840, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Micro- and Nano-Optics, Catenary Optics, and Subwavelength Electromagnetics
KEYWORDS: X-rays, Electron beams, Monte Carlo methods, Sputter deposition

Proceedings Article | 25 October 2016
Proc. SPIE. 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
KEYWORDS: Electron beams, Scanning electron microscopy, X-ray sources, Edge detection, Reticles, Calibration, Semiconducting wafers, Signal detection, Silicon, Metals

Proceedings Article | 25 October 2016
Proc. SPIE. 9685, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials
KEYWORDS: X-ray microscopy, Scanning electron microscopy, Tungsten, X-ray imaging, X-rays, Electron beams, Sensors, X-ray detectors, Signal attenuation, Beryllium

Proceedings Article | 25 October 2016
Proc. SPIE. 9685, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials
KEYWORDS: X-ray sources, X-rays, Electron beams, Magnetism, Spatial resolution, Tungsten, Lenses, X-ray imaging, Electrodes, Sensors

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