Geng Niu
at Institute of Electrical Engineering
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 6 February 2019 Paper
Proc. SPIE. 10842, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subdiffraction-limited Plasmonic Lithography and Innovative Manufacturing Technology
KEYWORDS: Principal component analysis, X-ray computed tomography, CT reconstruction, Image segmentation, X-rays, Chromium, Scanning electron microscopy, Computed tomography, X-ray imaging

Proceedings Article | 24 January 2019 Paper
Proc. SPIE. 10840, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Micro- and Nano-Optics, Catenary Optics, and Subwavelength Electromagnetics
KEYWORDS: Electron beams, Sputter deposition, X-rays, Monte Carlo methods

Proceedings Article | 25 October 2016 Paper
Proc. SPIE. 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
KEYWORDS: Electron beams, Reticles, Edge detection, Calibration, Metals, X-ray sources, Silicon, Scanning electron microscopy, Semiconducting wafers, Signal detection

Proceedings Article | 25 October 2016 Paper
Proc. SPIE. 9685, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials
KEYWORDS: Electron beams, Sensors, Signal attenuation, X-rays, Tungsten, X-ray microscopy, Scanning electron microscopy, X-ray imaging, Beryllium, X-ray detectors

Proceedings Article | 25 October 2016 Paper
Proc. SPIE. 9685, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials
KEYWORDS: Electron beams, Lenses, Sensors, Electrodes, X-rays, Tungsten, X-ray sources, Magnetism, Spatial resolution, X-ray imaging

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top