Prof. Gennadii P. Zhigalskii
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5469, Fluctuations and Noise in Materials
KEYWORDS: Semiconductors, Thin films, Scattering, Metals, Resistance, Nondestructive evaluation, Control systems, Electronic components, Aluminum, Resistors

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