Dr. Gennady P. Berman
at Los Alamos National Lab
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 11 February 2011 Paper
Proc. SPIE. 7926, Micromachining and Microfabrication Process Technology XVI
KEYWORDS: Infrared sensors, Mirrors, Fabry–Perot interferometers, Resonators, Sensors, Spectroscopy, Heterodyning, Optical resonators, Micromirrors, Optical microcavities

Proceedings Article | 10 February 2011 Paper
Proc. SPIE. 7924, Atmospheric and Oceanic Propagation of Electromagnetic Waves V
KEYWORDS: Gaussian beams, Sensors, Laser beam propagation, Modulators, Turbulence, Scintillation, Atmospheric propagation, Signal detection, Beam propagation method, Spiral phase plates

Proceedings Article | 27 February 2010 Paper
Proc. SPIE. 7588, Atmospheric and Oceanic Propagation of Electromagnetic Waves IV
KEYWORDS: Phase modulation, Sensors, Numerical simulations, Laser beam propagation, Modulators, Scintillation, Atmospheric turbulence, Atmospheric propagation, Atmospheric scintillation, Radio propagation

Proceedings Article | 23 January 2010 Paper
Proc. SPIE. 7608, Quantum Sensing and Nanophotonic Devices VII
KEYWORDS: Microscopes, Diamond, Sensors, Stereoscopy, Luminescence, Magnetism, Image resolution, Magnetic sensors, Spatial resolution, Nanocrystals

Proceedings Article | 24 February 2009 Paper
Proc. SPIE. 7200, Atmospheric Propagation of Electromagnetic Waves III
KEYWORDS: Photodetectors, Refractive index, Computer programming, Spatial light modulators, Turbulence, Scintillation, Atmospheric turbulence, Data communications, Atmospheric propagation, Pulsed laser operation

Showing 5 of 8 publications
Conference Committee Involvement (4)
Noise and Information in Nanoelectronics, Sensors, and Standards III
24 May 2005 | Austin, Texas, United States
Noise and Information in Nanoelectronics, Sensors, and Standards II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Fluctuations and Noise in Photonics and Quantum Optics II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise and Information in Nanoelectronics, Sensors, and Standards
2 June 2003 | Santa Fe, New Mexico, United States
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