Dr. Georg Boeck
Prof. Dr. Ing. at Technische Univ Berlin
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Oscillators, Electrodes, Resistance, Capacitance, Transistors, Field effect transistors, Resistors, Device simulation, Solid modeling, Amplitude modulation

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top