George C. Goldsmith
Electronic Development Engineer at US Air Force
SPIE Involvement:
Conference Program Committee | Author
Publications (20)

Proceedings Article | 16 May 2006
Proc. SPIE. 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
KEYWORDS: Field programmable gate arrays, Image processing, Digital signal processing, Logic, Algorithm development, Distortion, Clocks, Commercial off the shelf technology, Mathematics, Image sensors

Proceedings Article | 20 May 2005
Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
KEYWORDS: Semiconducting wafers, Cryogenics, Electronics, Control systems, Body temperature, Yield improvement, Photomasks, Metals, Etching, Ceramics

Proceedings Article | 20 May 2005
Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
KEYWORDS: Resistors, Infrared radiation, Projection systems, Bridges, Thermography, Infrared imaging, Silicon, Electronics, Cryogenics, Infrared technology

Proceedings Article | 4 August 2004
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Infrared radiation, Projection systems, Resistance, Nonuniformity corrections, Algorithm development, Control systems, Field effect transistors, Field programmable gate arrays, Cameras, Data processing

Proceedings Article | 4 August 2004
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Sensors, Image processing, Nonuniformity corrections, Black bodies, Calibration, Projection systems, Data modeling, Sensor calibration, Time metrology, Infrared sensors

Showing 5 of 20 publications
Conference Committee Involvement (6)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
17 March 2008 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
10 April 2007 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
18 April 2006 | Orlando (Kissimmee), Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
29 March 2005 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
13 April 2004 | Orlando, Florida, United States
Showing 5 of 6 Conference Committees
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