Dr. George Nagy
Professor Emeritus at Rensselaer Polytechnic Institute
SPIE Involvement:
Area of Expertise:
optical character recognition , document image analysis , remote sensing , statistical pattern recognition , interactive computer vision , computational geometry
Profile Summary

Student, teacher, reviewer, referee and critic of research in pattern recognition and image processing

Publications (20)

SPIE Journal Paper | September 3, 2015
JEI Vol. 24 Issue 05
KEYWORDS: Image segmentation, Visualization, Image classification, Databases, Feature extraction, RGB color model, Binary data, Data modeling, Classification systems, Printing

PROCEEDINGS ARTICLE | February 8, 2015
Proc. SPIE. 9402, Document Recognition and Retrieval XXII
KEYWORDS: Agriculture, Data modeling, Visualization, Databases, Image segmentation, Machine learning, Analytical research, Optical character recognition, Taxonomy, Expectation maximization algorithms

SPIE Journal Paper | December 8, 2014
JEI Vol. 23 Issue 06
KEYWORDS: Quantization, Image classification, Error analysis, Hough transforms, Optical character recognition, Image processing, Detection and tracking algorithms, Photography, Image segmentation, Feature extraction

Proc. SPIE. 9021, Document Recognition and Retrieval XXI
KEYWORDS: Carbon, MATLAB, Detection and tracking algorithms, Image processing, Ions, Hough transforms, Distance measurement, Solids, Analytical research, Neodymium

PROCEEDINGS ARTICLE | February 4, 2013
Proc. SPIE. 8658, Document Recognition and Retrieval XX
KEYWORDS: MATLAB, Image compression, Image segmentation, Image processing, Scanners, Reflectivity, Feature extraction, Raster graphics, Optical character recognition, Chemical elements

PROCEEDINGS ARTICLE | February 4, 2013
Proc. SPIE. 8658, Document Recognition and Retrieval XX
KEYWORDS: Statistical analysis, Data modeling, Error analysis, Nickel, Inspection, Computer science, Image classification, Optical character recognition, Optimization (mathematics), Statistical modeling

Showing 5 of 20 publications
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