Prof. George A. Stanciu
Director/CMMIP at Univ Politehnica Bucuresti
SPIE Involvement:
Author
Publications (9)

SPIE Journal Paper | 20 January 2023 Open Access
Jeremy Belhassen, Simcha Glass, Eti Teblum, George Stanciu, Denis E. Tranca, Zeev Zalevsky, Stefan Stanciu, Avi Karsenty
APN, Vol. 2, Issue 02, 026002, (January 2023) https://doi.org/10.1117/12.10.1117/1.APN.2.2.026002
KEYWORDS: Absorption, Gold, Scattering, Optical properties, Plasmons, Super resolution microscopy, Atomic force microscopy, Light sources and illumination, Simulations, Photonics

Proceedings Article | 3 October 2019 Paper
Stefan Stanciu, Denis Tranca, Laura Pastorino, Stefania Boi, Young Min Song, Young Jin Yoo, Satoshi Ishii, Fang Yang, Aiguo Wu, Radu Hristu, George Stanciu
Proceedings Volume 11207, 112071K (2019) https://doi.org/10.1117/12.2527401
KEYWORDS: Dielectrics, Optical coatings, Near field scanning optical microscopy, Near field optics, Nanostructuring, Toxic industrial chemicals, Optical microscopy, Nanoparticles, Optical properties, Biosensing

Proceedings Article | 14 February 2018 Presentation + Paper
E. Borisova, Ts. Genova-Hristova, P. Troyanova, E. Pavlova, I. Terziev, O. Semyachkina-Glushkovskaya, M. Lomova, E. Genina, G. Stanciu, D. Tranca, L. Avramov
Proceedings Volume 10467, 104670M (2018) https://doi.org/10.1117/12.2289119
KEYWORDS: Skin, Tissues, Diagnostics, Spectroscopy, Pathology, Tissue optics, Luminescence, Reflectivity, Microscopy

Proceedings Article | 5 January 2017 Paper
Ts. Genova, E. Borisova, G. Stanciu, D. Tranca, I. Terziev, N. Penkov, B. Vladimirov, M. Lomova, O. Semyachkina-Glushkovskaya, L. Avramov
Proceedings Volume 10226, 1022617 (2017) https://doi.org/10.1117/12.2260712
KEYWORDS: Tissues, Microscopy, Second-harmonic generation, Collagen, Diagnostics, Luminescence, Biopsy, Cancer, Tissue optics, Statistical analysis

Proceedings Article | 7 May 2007 Paper
Iuliana Iordache, D. Apostol, O. Iancu, G. Stanciu, P. Logofatu, V. Damian, F. Garoi, B. Savu, M. Bojan
Proceedings Volume 6635, 663503 (2007) https://doi.org/10.1117/12.741833
KEYWORDS: Interferometers, Calibration, Metrology, Interferometry, Fringe analysis, Ferroelectric materials, Standards development, Light sources, Microelectromechanical systems, Laser stabilization

Showing 5 of 9 publications
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