George Talor
Distinguished Engineer at Jazz Semiconductor Inc
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | October 13, 2011
Proc. SPIE. 8188, Millimetre Wave and Terahertz Sensors and Technology IV
KEYWORDS: Radar, Capacitors, Metals, Manufacturing, Fourier transforms, Capacitance, Signal processing, Diodes, Resistors, Molybdenum

PROCEEDINGS ARTICLE | June 14, 1999
Proc. SPIE. 3677, Metrology, Inspection, and Process Control for Microlithography XIII
KEYWORDS: Etching, Image processing, Atomic force microscopy, Scanning electron microscopy, Image quality, Plasma etching, Critical dimension metrology, Line edge roughness, Edge roughness, Plasma

PROCEEDINGS ARTICLE | June 1, 1992
Proc. SPIE. 1672, Advances in Resist Technology and Processing IX
KEYWORDS: Lithography, Statistical analysis, Data modeling, Scanning electron microscopy, Photoresist materials, Solids, Optimization (mathematics), Photoresist processing, Thermal modeling, Photoresist developing

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