Dr. George Nehmetallah
Assistant Professor at Catholic Univ of America
SPIE Involvement:
Senior status | Conference Program Committee | Author | Student Chapter Advisor
Publications (52)

Proceedings Article | 13 May 2019
Proc. SPIE. 10995, Pattern Recognition and Tracking XXX
KEYWORDS: Digital holography, Fourier transforms, Computer generated holography, Joint transforms, Optical correlators, 3D image processing

Proceedings Article | 13 May 2019
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Doppler effect, Polarization, Speckle, Sensors, Fourier transforms, Heterodyning, Digital image correlation, Motion measurement

Proceedings Article | 13 May 2019
Proc. SPIE. 10990, Computational Imaging IV
KEYWORDS: Diffraction, Data modeling, Video, Microscopy, 3D modeling, Tomography, Spatial light modulators, Refraction, Charge-coupled devices, 3D image processing

Proceedings Article | 4 March 2019
Proc. SPIE. 10925, Photonic Instrumentation Engineering VI
KEYWORDS: Signal to noise ratio, Laser sources, Continuous wave operation, Speckle, LIDAR, Sensors, Fourier transforms, Interference (communication), Laser optics, Ranging

Proceedings Article | 6 July 2018
Proc. SPIE. 10700, Ground-based and Airborne Telescopes VII
KEYWORDS: Actuators, Telescopes, Stars, Cameras, Sensors, Field programmable gate arrays, Control systems, Space telescopes, Gyroscopes, Filtering (signal processing)

Proceedings Article | 15 May 2018
Proc. SPIE. 10669, Computational Imaging III
KEYWORDS: Signal to noise ratio, Optical filters, Computational imaging, Detection and tracking algorithms, Imaging systems, Computing systems, Linear filtering, Modulation transfer functions, Performance modeling, Systems modeling

Showing 5 of 52 publications
Conference Committee Involvement (6)
Dimensional Optical Metrology and Inspection for Practical Applications VIII
26 April 2020 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Showing 5 of 6 published special sections
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