Dr. George Nehmetallah
Assistant Professor at Catholic Univ of America
SPIE Involvement:
Senior status | Conference Program Committee | Author | Student Chapter Advisor
Publications (48)

PROCEEDINGS ARTICLE | July 6, 2018
Proc. SPIE. 10700, Ground-based and Airborne Telescopes VII
KEYWORDS: Actuators, Telescopes, Stars, Cameras, Sensors, Field programmable gate arrays, Control systems, Space telescopes, Gyroscopes, Filtering (signal processing)

PROCEEDINGS ARTICLE | May 15, 2018
Proc. SPIE. 10669, Computational Imaging III
KEYWORDS: Signal to noise ratio, Optical filters, Computational imaging, Detection and tracking algorithms, Imaging systems, Computing systems, Linear filtering, Modulation transfer functions, Performance modeling, Systems modeling

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Optical imaging, Diffraction, Convolutional neural networks, 3D modeling, Tomography, Spatial light modulators, Refraction, Charge-coupled devices, Inverse optics, 3D image processing

PROCEEDINGS ARTICLE | May 2, 2018
Proc. SPIE. 10641, Sensors and Systems for Space Applications XI
KEYWORDS: Thermography, Light sources, Carbon dioxide, Sensors, Calibration, Gases, Lamps, Infrared radiation, Analog electronics, Absorption

PROCEEDINGS ARTICLE | April 27, 2018
Proc. SPIE. 10646, Signal Processing, Sensor/Information Fusion, and Target Recognition XXVII
KEYWORDS: Actuators, Telescopes, Clocks, Stars, Cameras, Sensors, Computing systems, Control systems, Computer programming, Gyroscopes

SPIE Journal Paper | April 26, 2018
OE Vol. 57 Issue 04
KEYWORDS: 3D modeling, 3D image processing, Refraction, Optical tomography, Diffraction, Spatial light modulators, Image processing, Charge-coupled devices, Visualization, Convolutional neural networks

Showing 5 of 48 publications
Conference Committee Involvement (5)
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, Maryland, United States
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