Prof. Gerd Häusler
Professor at Friedrich-Alexander Univ Erlangen-Nürnberg
SPIE Involvement:
Conference Program Committee | Author
Publications (33)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Signal to noise ratio, Multimode fibers, Diffraction, Coherence (optics), Speckle, Laser applications, Diffusers, Projection systems, Spatial coherence

PROCEEDINGS ARTICLE | March 4, 2015
Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014
KEYWORDS: Mirrors, Fringe analysis, Modulation, Mechanics, Imaging systems, Phase shift keying, Deflectometry, 3D metrology, Projection systems, Phase shifts

PROCEEDINGS ARTICLE | May 23, 2013
Proc. SPIE. 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
KEYWORDS: 3D acquisition, Data modeling, Sensors, Electrodes, 3D modeling, Head, 3D metrology, Electroencephalography, Source localization, Brain

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Mirrors, Eye, Optical spheres, Cameras, Calibration, Glasses, Manufacturing, Interferometry, Deflectometry, Aspheric lenses

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Point spread functions, Mirrors, Light sources, Reflection, Spatial frequencies, Calibration, Interferometry, Computer programming, Deflectometry, Signal processing

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Signal to noise ratio, Microscopes, Fringe analysis, Speckle, Sensors, Microscopy, Inspection, Data acquisition, 3D metrology, Objectives

Showing 5 of 33 publications
Conference Committee Involvement (1)
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
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