Prof. Gerd Jäger
Consultant/Retired at Technische Univ Ilmenau
SPIE Involvement:
Conference Program Committee | Author
Publications (26)

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Microscopes, Nanostructures, Metrology, Sensors, Laser applications, Atomic force microscopy, CCD cameras, Collimators, Objectives, Laser beam diagnostics

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Optical filters, Mirrors, Beam splitters, Polarization, Interferometers, Error analysis, Interferometry, Measurement devices, Motion measurement, Standards development

PROCEEDINGS ARTICLE | August 25, 2010
Proc. SPIE. 7767, Instrumentation, Metrology, and Standards for Nanomanufacturing IV
KEYWORDS: Optical components, Beam splitters, Metrology, Optical spheres, Interferometers, Sensors, Silicon, Interferometry, Head, 3D metrology

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Mirrors, Interferometers, Calibration, Interferometry, Wavefronts, Turbulence, Body temperature, Environmental sensing, Temperature metrology, Fizeau interferometers

PROCEEDINGS ARTICLE | May 22, 2009
Proc. SPIE. 7378, Scanning Microscopy 2009
KEYWORDS: Mirrors, Beam splitters, Metrology, Interferometers, Calibration, Monte Carlo methods, Distance measurement, Scanning probe microscopy, Thermal modeling, Scanning probe microscopes

PROCEEDINGS ARTICLE | May 18, 2009
Proc. SPIE. 7356, Optical Sensors 2009
KEYWORDS: Reflectors, Mirrors, Prisms, Beam splitters, Interferometers, Sensors, Calibration, Head, Distance measurement, Diodes

Showing 5 of 26 publications
Conference Committee Involvement (5)
Optical Measurement Systems for Industrial Inspection
16 June 2009 | Munich, Germany
Optical Measurement Systems for Industrial Inspection
18 June 2007 | Munich, Germany
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Optical Metrology in Production Engineering
27 April 2004 | Strasbourg, France
Optical Measurement Systems for Industrial Inspection III
23 June 2003 | Munich, Germany
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