Dr. Gerhard Kloos
at Hella KG Hueck & Co.
SPIE Involvement:
Author | Instructor
Publications (11)

SPIE Press Book | 10 January 2018

Proceedings Article | 2 September 2008
Proc. SPIE. 7059, Nonimaging Optics and Efficient Illumination Systems V
KEYWORDS: Optical components, Light emitting diodes, Safety, Matrices, Numerical simulations, Collimation, Light sources and illumination, Paraxial approximations, Data communications, Tolerancing

Proceedings Article | 28 April 2008
Proc. SPIE. 7003, Optical Sensors 2008
KEYWORDS: Mirrors, Optical properties, Interferometers, Sensors, Matrices, Error analysis, Interferometry, Transducers, Tolerancing, Michelson interferometers

Proceedings Article | 25 April 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Phase conjugation, Optical components, Reflectors, Mirrors, Retroreflectors, Interferometers, Sensors, Collimation, Ray tracing, Geometrical optics

Proceedings Article | 25 October 2007
Proc. SPIE. 6675, Optical Modeling and Performance Predictions III
KEYWORDS: Actuators, Optical components, Interferometers, Dielectrics, Kerr effect, Electro optics, Electromagnetism, Electrostriction, Electromechanical design, Anisotropy

Showing 5 of 11 publications
Course Instructor
SC911: Optical Layout and Analysis Using the Matrix Approach
In optical design, the matrix method is used to find a solution to a given optical task, which can then be refined by optical-design software or analytical methods of aberration balancing. In some cases, the method can be helpful to demonstrate that there is no solution possible under the given boundary conditions. Quite often it is of practical importance and theoretical interest to get an overview on the "solution space" of a problem. The paraxial approach might then serve as a guideline during optimization in a similar way as a map does in an unknown landscape. The course familiarizes attendees with the application of the method of transfer matrices and related techniques to a variety of optical engineering problems. After an introduction to the method, it describes applications to imaging optics as well as to illumination systems. The course concentrates on devices of practical importance as zoom systems, interferometric devices, and laser resonators. Emphasis is also on providing a toolbox for first-order tolerancing and sensitivity analysis. The course comprises the analysis of anamorphic optical devices, because of their growing market penetration.
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