Dr. Gert Witvoet
at TNO
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Profile Summary

Gert Witvoet is a dynamics and control specialist at TNO Technical Sciences. He received his MSc degree (cum laude) and PhD degree in mechanical engineering, with a control engineering specialization, from the Eindhoven University of Technology in 2007 and 2011 respectively. His PhD research encompassed the application of control theory to nuclear fusion processes and instabilities. His current research interests include dynamical modeling and analysis, opto-mechatronic systems, control engineering and advanced control. He is also a part-time assistant professor on motion control for scientific instruments at the Eindhoven University of Technology.
Publications (7)

PROCEEDINGS ARTICLE | November 17, 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: Optical components, Telescopes, Mirrors, Optical design, Interferometers, Space telescopes, Heterodyning, Computer aided design, Optical instrument design, Zerodur

PROCEEDINGS ARTICLE | August 8, 2016
Proc. SPIE. 9906, Ground-based and Airborne Telescopes VI
KEYWORDS: Actuators, Telescopes, Mirrors, Reliability, Control systems, Photoacoustic tomography, Feedback loops, Large telescopes, Large telescopes, Adaptive control, Feedback control

PROCEEDINGS ARTICLE | July 29, 2016
Proc. SPIE. 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
KEYWORDS: Mirrors, Sensors, Computer programming, 3D modeling, 3D metrology, Modal analysis, Finite element methods, Aluminum, Computer aided design, Solid modeling

PROCEEDINGS ARTICLE | July 22, 2016
Proc. SPIE. 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
KEYWORDS: Actuators, Mirrors, Mirrors, Interferometers, Sensors, Computer programming, Space mirrors, Computer aided design, Feedback control, Disk lasers, Environmental sensing

PROCEEDINGS ARTICLE | March 8, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Semiconductors, Lithography, Metrology, Interferometers, Sensors, Image resolution, Nondestructive evaluation, Atomic force microscopy, Distance measurement, High dynamic range imaging, Atomic force microscope, Optical alignment, Scanning probe microscopy, Semiconducting wafers, Overlay metrology

SPIE Journal Paper | January 28, 2015
JATIS Vol. 1 Issue 01
KEYWORDS: Photoacoustic tomography, Actuators, Mirrors, Prototyping, Control systems, Sensors, Virtual colonoscopy, Large telescopes, Linear filtering, Systems modeling

Showing 5 of 7 publications
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