Dr. Giancarlo Pedrini
Coherent Measurement Group Leader at Institut für Technische Optik
SPIE Involvement:
Conference Program Committee | Author
Publications (72)

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10503, Quantitative Phase Imaging IV
KEYWORDS: Microscopes, Point spread functions, Imaging systems, Scattering, Scattering media, Microscopy, Light scattering, Speckle pattern, Diffusers, Objectives

SPIE Journal Paper | December 7, 2017
OE Vol. 56 Issue 12
KEYWORDS: Reconstruction algorithms, Speckle imaging, Image quality, Scattering media, Scattering, Speckle pattern, Speckle, Cameras, Laser scattering, Fourier transforms

PROCEEDINGS ARTICLE | July 11, 2017
Proc. SPIE. 10331, Optics for Arts, Architecture, and Archaeology VI
KEYWORDS: Thermography, Mirrors, Defect detection, Modulation, Speckle, Fourier transforms, Interferometry, Nondestructive evaluation, Phase shift keying, Cultural heritage, Shearography, Signal detection, Lead

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10335, Digital Optical Technologies 2017
KEYWORDS: Signal to noise ratio, Hyperspectral imaging, Temporal coherence, Mirrors, Prisms, Beam splitters, Holograms, Holography, Light emitting diodes, Optical signal processing, 3D image reconstruction, Digital holography, Coherence (optics), Speckle, Light

SPIE Journal Paper | June 1, 2017
JMI Vol. 4 Issue 02
KEYWORDS: Tissue optics, Biomedical optics, Soft tissue optics, Elastography, Digital image correlation, Medical imaging, 3D modeling

SPIE Journal Paper | August 8, 2016
OE Vol. 55 Issue 12
KEYWORDS: Digital holography, Digital image correlation, Sensors, Spiral phase plates, Wavefronts, Holograms, 3D metrology, Optical engineering, 3D image processing, Digital imaging

Showing 5 of 72 publications
Conference Committee Involvement (4)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Unconventional Optical Imaging
22 April 2018 | Strasbourg, France
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
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