Dr. Gianluca Bacchin
VP Engineering at TriLumina Corp
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | February 18, 2010
Proc. SPIE. 7583, High-Power Diode Laser Technology and Applications VIII
KEYWORDS: Thermography, Quantum wells, High power lasers, Reliability, Laser resonators, Laser damage threshold, Tantalum, Optimization (mathematics), Semiconducting wafers, Nonabsorbing mirrors

PROCEEDINGS ARTICLE | February 24, 2009
Proc. SPIE. 7198, High-Power Diode Laser Technology and Applications VII
KEYWORDS: Defense and security, Semiconductors, Quantum wells, Lithium, Copper, Reliability, Semiconductor lasers, Electro optical systems, Laser systems engineering, Near field optics

PROCEEDINGS ARTICLE | January 29, 2008
Proc. SPIE. 6909, Novel In-Plane Semiconductor Lasers VII
KEYWORDS: Semiconductors, Diffraction, Optical filters, Mirrors, Mode locking, High power lasers, Photography, Reliability, Semiconductor lasers, Nonabsorbing mirrors

PROCEEDINGS ARTICLE | February 7, 2007
Proc. SPIE. 6456, High-Power Diode Laser Technology and Applications V
KEYWORDS: Quantum wells, Waveguides, High power lasers, Coating, Reliability, Laser development, Semiconductor lasers, Epitaxy, Pulsed laser operation, Nonabsorbing mirrors

PROCEEDINGS ARTICLE | February 22, 2006
Proc. SPIE. 6133, Novel In-Plane Semiconductor Lasers V
KEYWORDS: Packaging, Optical components, Continuous wave operation, High power lasers, Manufacturing, Reliability, Laser applications, Semiconductor lasers, Optics manufacturing, Nanolithography

PROCEEDINGS ARTICLE | April 1, 2005
Proc. SPIE. 5738, Novel In-Plane Semiconductor Lasers IV
KEYWORDS: Quantum wells, Etching, High power lasers, Manufacturing, Laser applications, Laser welding, Semiconductor lasers, Epitaxy, Semiconducting wafers, Tolerancing

Showing 5 of 7 publications
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