Prof. Gijs Bosman
at Univ of Florida
SPIE Involvement:
Publications (4)

Proceedings Article | 24 February 2009
Proc. SPIE. 7204, Micromachining and Microfabrication Process Technology XIV
KEYWORDS: Semiconductors, Thin films, Sensors, Resistance, Physics, Computer simulations, Monte Carlo methods, Optoelectronic devices, Single walled carbon nanotubes, Instrument modeling

Proceedings Article | 8 June 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Semiconductors, Oxides, Electrodes, Denoising, Silicon, Resistance, Field effect transistors, Bismuth, Semiconducting wafers, Nanowires

Proceedings Article | 23 May 2005
Proc. SPIE. 5841, Fluctuations and Noise in Biological, Biophysical, and Biomedical Systems III
KEYWORDS: Image processing algorithms and systems, Breast, MATLAB, Tumors, Tissues, Magnetic resonance imaging, Image segmentation, Interference (communication), Amplifiers, Tomography

Proceedings Article | 12 May 2003
Proc. SPIE. 5113, Noise in Devices and Circuits
KEYWORDS: Oxides, Interfaces, Silicon, Interference (communication), Doping, Computer simulations, Field effect transistors, Device simulation, Reverse engineering, Reverse modeling

Conference Committee Involvement (1)
Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems
23 October 2005 | Boston, MA, United States
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