Prof. Gijs Bosman Profile

Prof. Gijs Bosman

at Univ of Florida

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 24 February 2009

1/f noise in single-walled carbon nanotube films

Ashkan Behnam, Gijs Bosman, Ant Ural

Proc. SPIE. 7204, Micromachining and Microfabrication Process Technology XIV

KEYWORDS: Semiconductors, Thin films, Sensors, Resistance, Physics, Computer simulations, Monte Carlo methods, Optoelectronic devices, Single walled carbon nanotubes, Instrument modeling

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Proceedings Article | 8 June 2007

Assessing the 1/f noise contributions of accidental defects in advanced semiconductor devices

Gijs Bosman, Derek Martin, Shahed Reza

Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials

KEYWORDS: Semiconductors, Oxides, Electrodes, Denoising, Silicon, Resistance, Field effect transistors, Bismuth, Semiconducting wafers, Nanowires

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Proceedings Article | 23 May 2005

Image guided noise tomography for increased specificity of magnetic resonance imaging

Shahed Reza, Gijs Bosman, George Duensing, Feng Huang, Charles Saylor

Proc. SPIE. 5841, Fluctuations and Noise in Biological, Biophysical, and Biomedical Systems III

KEYWORDS: Image processing algorithms and systems, Breast, MATLAB, Tumors, Tissues, Magnetic resonance imaging, Image segmentation, Interference (communication), Amplifiers, Tomography

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Proceedings Article | 12 May 2003

Computer simulation and reverse engineering of trap-assisted generation-recombination noise in advanced silicon MOSFETs

Gijs Bosman, Fan-Chi Hou, Derek Martin, Juan Sanchez

Proc. SPIE. 5113, Noise in Devices and Circuits

KEYWORDS: Oxides, Interfaces, Silicon, Interference (communication), Doping, Computer simulations, Field effect transistors, Device simulation, Reverse engineering, Reverse modeling

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Conference Committee Involvement (1)

Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems

23 October 2005 | Boston, MA, United States

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