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The main scientific instrument of the ASTRI-Horn telescope is an innovative and compact Camera with Silicon- Photomultiplier based detectors and a specifically designed fast read-out electronics based on a custom peak-detector mode. The thermo-mechanical assembly is designed to host both the entire electronics chain, from the sensors to the raw data transmission system and the calibration system, and the complete thermoregulation system.
This contribution gives a high level description of the T/M and electrical design of the Cherenkov Camera, it describes the assembling procedure of its different subsystems and their integration into the complete camera system. A discussion about possible design improvements coming from the problems/difficulties encountered during assembly is also presented. Finally, results from engineering tests conducted in-field are also presented.
The ASTRI SST-2M telescope structure and mirrors have been installed at the INAF observing station at Serra La Nave, on Mt. Etna (Sicily, Italy) in September 2014. Its performance verification phase began in autumn 2015. Part of the scheduled activities foresees the study and characterization of the optical and opto-mechanical performance of the telescope prototype.
In this contribution we report the results achieved in terms of kinematic model analysis, mirrors reflectivity evolution, telescopes positioning, flexures and pointing model and the thermal behavior.
Deflectometry is an interesting technique because it allows the fast characterization of free-form optics. The capabilities of deflectometry in measuring medium-high frequencies are well known, but the low frequencies error characterization is more challenging. Our facility design foresees an innovative approach based on the acquisition of multiple direct images to enhance the performance on the challenging low frequencies range.
This contribution presents the error-budget analysis of the measuring method and a study of the configuration tolerances required to allow the use of deflectometry in the realization of optical components suitable for astronomical projects with a requirement of high accuracy for the optics. As test examples we took into account mirrors for the E-ELT telescope.
As an example, we describe the results obtained measuring the primary mirror segments of the Cherenkov prototypal telescope manufactured by the Italian National Institute for Astrophysics in the context of the ASTRI Project. This specific case is challenging because the segmentation of the polynomial primary mirror lead to individual mirrors with deviations from the spherical optical design up to a few millimeters.
The next generation of Imaging Atmospheric Cherenkov Telescope will explore the uppermost end of the Very High Energy domain up to about few hundreds of TeV with unprecedented sensitivity, angular resolution and imaging quality.
To this end, the Italian National Institute of Astrophysics (INAF) is currently developing a scientific and technological telescope prototype for the implementation of the Cherenkov Telescope Array (CTA) observatory. The Italian ASTRI program foresees the full design, development, installation and calibration of a Small Size 4-meter class Telescope, adopting an aplanatic, wide-field, double-reflection optical layout in a Schwarzschild-Couder configuration.
In this paper we discuss about the technological solutions adopted for the telescope and for the mirrors. In particular we focus on the structural and electro-mechanical design of the telescope, now under fabrication. The results on the optical performance derived from mirror prototypes are here described, too.
Silicon Pore Optics is an enabling technology for future L- and M-class astrophysics X-ray missions, which require high angular resolution (~5 arc seconds) and large effective area (1 to 2 m2 at a few keV). The technology exploits the high-quality of super-polished 300 mm silicon wafers and the associated industrial mass production processes, which are readily available in the semiconductor industry. The plan-parallel wafers have a surface roughness better than 0.1 nm rms and are diced, structured, wedged, coated, bent and stacked to form modular Silicon Pore Optics, which can be grouped into a larger optic. The modules are assembled from silicon alone, with all the mechanical advantages, and form an intrinsically stiff pore structure.
The optics design was initially based on long (25 to 50 m) focal length X-ray telescopes, which could achieve several arc second angular resolution by curving the silicon mirror in only one direction (conical approximation).
Recently shorter focal length missions (10 to 20 m) have been discussed, for which we started to develop Silicon Pore Optics having a secondary curvature in the mirror, allowing the production of Wolter-I type optics, which are on axis aberration-free.
In this paper we will present the new manufacturing process, the results achieved and the lessons learned.
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