Prof. Giovanni G. Berti
at XRD-Tools
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

Proceedings Article | 11 September 2014
Proc. SPIE. 9212, Developments in X-Ray Tomography IX
KEYWORDS: Signal to noise ratio, X-ray optics, Sensors, Calibration, X-rays, Inspection, Time metrology, Detector development, X-ray detectors, Prototyping

Proceedings Article | 28 April 2006
Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology
KEYWORDS: Diffraction, Metrology, Data modeling, Calibration, X-rays, X-ray diffraction, Physics, Surface properties, Testing and analysis, Surface finishing

Proceedings Article | 22 September 2005
Proc. SPIE. 5906, Astrobiology and Planetary Missions
KEYWORDS: Diffraction, Data modeling, Aerospace engineering, Sensors, Calibration, Crystals, X-ray diffraction, Robotics, Data processing, Collimation

Conference Committee Involvement (2)
Instruments, Methods, and Missions for Astrobiology IX
14 August 2006 | San Diego, California, United States
Instruments, Methods, and Missions for Astrobiology IX
31 July 2005 | San Diego, California, United States
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