Dr. Giovanni Bianucci
Technical Tactical Marketing at Media Lario Technologies Srl
SPIE Involvement:
Author
Publications (16)

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Wafer-level optics, Diffraction, Mirrors, Optical design, X-rays, Silicon, Optical alignment, Spatial resolution, X-ray telescopes, Device simulation

PROCEEDINGS ARTICLE | September 5, 2017
Proc. SPIE. 10402, Earth Observing Systems XXII
KEYWORDS: Electronics, Satellites, Remote sensing, Satellite imaging, Optical alignment, Modulation transfer functions, Astronomical imaging, System integration, Optics manufacturing

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Point spread functions, Telescopes, Mirrors, X-ray optics, Optical alignment, Spatial resolution, X-ray telescopes, Mirror structures

PROCEEDINGS ARTICLE | October 12, 2016
Proc. SPIE. 9963, Advances in X-Ray/EUV Optics and Components XI
KEYWORDS: Diffraction, Point spread functions, Mirrors, X-ray optics, Crystals, X-rays, X-ray sources, Silicon, Collimation, Laser crystals

PROCEEDINGS ARTICLE | July 29, 2016
Proc. SPIE. 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
KEYWORDS: Carbon, Telescopes, Telescopes, Mirrors, Astronomy, Nickel, Manufacturing, Space telescopes, Space telescopes, Active optics, Active optics, Optics manufacturing, Talc

PROCEEDINGS ARTICLE | July 22, 2016
Proc. SPIE. 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
KEYWORDS: Reflectors, Reflectors, Telescopes, Telescopes, Astronomy, Metrology, Skin, Nickel, Interfaces, Manufacturing, Photogrammetry, Aluminum

Showing 5 of 16 publications
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